ABSOLUTE CALIBRATION AND CHARACTERIZATION OF THE MULTIBAND IMAGING PHOTOMETER FOR SPITZER. I. THE STELLAR CALIBRATOR SAMPLE AND THE 24 μm CALIBRATION
نویسندگان
چکیده
We present the stellar calibrator sample and the conversion from instrumental to physical units for the 24 μm channel of the Multiband Imaging Photometer for Spitzer (MIPS). The primary calibrators are A stars, and the calibration factor based on those stars is 4.54× 10 MJy sr (DN/s), with a nominal uncertainty of 2%. We discuss the data-reduction procedures required to attain this accuracy; without these procdures, the calibration factor obtained using the automated pipeline at the Spitzer Science Center is 1.6%±0.6% lower. We extend this work to predict 24 μm flux densities for a sample of 238 stars which covers a larger range of flux densities and spectral types. We present a total of 348 measurements of 141 stars at 24 μm. This sample covers a factor of ∼ 460 in 24 μm flux density, from 8.6 mJy up to 4.0 Jy. We show that the calibration is linear over that range with respect to target flux and background level. The calibration is based on observations made using 3-second exposures; a preliminary analysis shows that the calibration factor may be 1% and 2% lower for 10and 30-second exposures, respectively. We also demonstrate that the calibration is very stable: over the course of the mission, repeated measurements of our routine calibrator, HD 159330, show a root-mean-square scatter of only 0.4%. Finally, we show that the point spread function (PSF) is well measured and allows us to calibrate extended sources accurately; Infrared Astronomy Satellite (IRAS) and MIPS measurements of a sample of nearby galaxies are identical within the uncertainties. Subject headings: infrared: stars—instrumentation: detectors
منابع مشابه
Reference optical phantoms for diffuse optical spectroscopy. Part 1--Error analysis of a time resolved transmittance characterization method.
Development, production quality control and calibration of optical tissue-mimicking phantoms require a convenient and robust characterization method with known absolute accuracy. We present a solid phantom characterization technique based on time resolved transmittance measurement of light through a relatively small phantom sample. The small size of the sample enables characterization of every ...
متن کاملDigital image correlation-based optical coherence elastography.
Optical coherence elastography (OCE) provides deformation or material properties, mapping of soft tissue. We aim to develop a robust speckle tracking OCE technique with improved resolution and accuracy. A digital image correlation (DIC)-based OCE technique was developed by combining an advanced DIC algorithm with optical coherence tomography (OCT). System calibration and measurement error evalu...
متن کاملScatterometry reference standards to improve tool matching and traceability in lithographical nanomanufacturing
High quality scatterometry standard samples have been developed to improve the tool matching between different scatterometry methods and tools as well as with high resolution microscopic methods such as scanning electron microscopy or atomic force microscopy and to support traceable and absolute scatterometric critical dimension metrology in lithographic nanomanufacturing. First samples based o...
متن کاملDevelopment of Experimental Techniques for Thermoelectric Properties Characterization of Low-Dimensional Structures
This work reports current efforts in developing experimental techniques applicable for thermoelectric properties characterization at micro and nanoscale. A one-dimensional transport model was used to asses the effects of heat leakage, non-symmetric boundary conditions, and electrical contact resistance, on thermoelectric properties measurements performed by transient Harman method. If the above...
متن کاملRadiometric Method for Emissivity Retrieval in High Reflective Materials
High reflective materials in the microwave region play a very important role in the realization of antenna reflectors for a broad range of applications, including radiometry. These reflectors have a characteristic emissivity which needs to be characterized accurately in order to perform a correct radiometric calibration of the instrument. Such a characterization can be performed by using open r...
متن کامل